A Semi-Automated Positioning System for Contact-Mode Atomic Force Microscopy (AFM)
نویسندگان
چکیده
منابع مشابه
Can atomic force microscopy achieve atomic resolution in contact mode?
Atomic force microscopy operating in the contact mode is studied using total-energy pseudopotential calculations. It is shown that, in the case of a diamond tip and a diamond surface, it is possible for a tip terminated by a single atom to sustain forces in excess of 30 nN. It is also shown that imaging at atomic resolution may be limited by blunting of the tip during lateral scanning.
متن کاملGamble mode: Resonance contact mode in atomic force microscopy
Active noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. W...
متن کاملVelocity dependent friction laws in contact mode atomic force microscopy.
Friction forces in the tip-sample contact govern the dynamics of contact mode atomic force microscopy. In ambient conditions typical contact radii between tip and sample are in the order of a few nanometers. In order to account for the large interaction area the dynamics of contact mode atomic force microscope (AFM) is investigated under the assumption of a multi-asperity contact interface betw...
متن کاملNoise reduction in atomic force microscopy: Resonance contact mode
Noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. We call ...
متن کاملEffective Parameters in Contact Mechanic for Micro/nano Particle Manipulation Based on Atomic Force Microscopy
The effect of geometry and material of the Micro/Nano particle on contact mechanic for manipulation was studied in this work based on atomic force microscopy. Hertz contact model simulation for EpH biological micro particle with spherical, cylindrical, and circular crowned roller shape was used to investigate the effect of geometry on contact simulation process in manipulation. Then, to val...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Transactions on Automation Science and Engineering
سال: 2013
ISSN: 1545-5955,1558-3783
DOI: 10.1109/tase.2012.2226154